Designed specifically for package board testing, the FA1811 achieves both high-precision contact with a total probing precision of 10 μm, and a testing speed rivaling generic flying probe testers to meet ever increasing demands for greater analytical power, faster testing speeds and reduced costs.
Key Features
- Achieve both high precision contact and high-speed probing in a space of 10 μm.
- Double test method delivers an operation rate of 100%.
- Full-net insulation continuity test using resistance: x10 max. speed*
- High-speed test using capacitance: x2 max. speed*
Key Features
- Achieve both high precision contact and high-speed probing in a space of 10 μm.
- Double test method delivers an operation rate of 100%.
- Full-net insulation continuity test using resistance: x10 max. speed*
- High-speed test using capacitance: x2 max. speed*
Specifications Overview
| Number of arms |
2 (Upper: 2) |
| Mountable probes |
CP1073 series |
| Measurement parameters and measurement ranges |
Resistance measurement : |
400.0 μΩ to 40.00 MΩ
4.000 Ω to 4.000 MΩ (T) |
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Capacitance measurement : |
100.0 fF to 10.00 μF |
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MLCC measurement : |
100.0 nF to 100.0 μF |
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Insulation measurement : |
1.000 kΩ to 100.0 GΩ
1.000 kΩ to 250.0 MΩ (T) |
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Capacitor insulation measurement : |
1.000 kΩ to 10.00 MΩ |
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High-voltage resistance measurement : |
1.000 kΩ to 100.0 GΩ
1.000 kΩ to 250.0 MΩ (T) |
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Leak current measurement : |
1.000 μA to 10.00 mA |
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Continuity : |
400 mΩ to 1.000 kΩ |
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Open measurement : |
4.000 Ω to 4.000 MΩ |
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Short measurement : |
400.0 mΩ to 40.00 kΩ |
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(T): When measuring via the TEST FIXTURE |
| Judgment range |
-99.9% to +999.9% or absolute value |
| Total probing precision |
10 μm (Square) |
| Probing pitch |
Min. 40 μm (when using CP1073-01) |
| Supported range of board thicknesses for clamping |
Follow option on BGA side |
| Probing area |
75 mm (2.95 in) × 75 mm (2.95 in) |
| Power supply |
200 V AC ±10% (three phase) 50/60 Hz (200 V, 220 V AC: specified upon order)
Maximum power consumption: 5 kVA |
| Dimensions and mass |
1300 mm (51.18 in) W × 1670 mm (65.75 in) H × 1700 mm (66.93 in) D (Excluding protruding parts), 2000 kg (70,546.7 oz) |
TEST FIXTURE CP1165-11 Specifications
| Board dimensions |
Square 10 mm (0.39 in) to Square 80 mm (3.15 in) |
| Supported range of board thicknesses for clamping |
0.1 mm (0.004 in) to 5.0 mm (0.20 in) |
| Notes |
Designed for each board |
| Board clamping |
Holder, shutter, and vacuum pump required separately |
| Supported pad diameter |
200 μm or larger, 300 μm or larger when using Kelvin probe |
| Max. number of pins |
8192 |
VACUUM UNIT FOR CAPACITANCE TEST E4101 Specifications
| Board dimensions |
50 mm (1.97 in) W × 90 mm (3.54 in) D to 105 mm (4.13 in) × 250 mm (9.84 in) |
| Supported range of board thicknesses for clamping |
0.1 mm (0.004 in) to 0.8 mm (0.031 in) |
| Notes |
To accommodate the entire range of substrate thickness, it is necessary to replace the spacer for substrate thickness adjustment. |
| Board clamping |
VACUUM PUMP E4106 required separately |