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HIOKI FA1811 FLYING PROBE TESTER

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Shop : Tools Bangladesh
Product ID : 4499
Brand : Hioki
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Designed specifically for package board testing, the FA1811 achieves both high-precision contact with a total probing precision of 10 μm, and a testing speed rivaling generic flying probe testers to meet ever increasing demands for greater analytical power, faster testing speeds and reduced costs.

Key Features

  • Achieve both high precision contact and high-speed probing in a space of 10 μm.
  • Double test method delivers an operation rate of 100%.
  • Full-net insulation continuity test using resistance: x10 max. speed*
  • High-speed test using capacitance: x2 max. speed*

Key Features

  • Achieve both high precision contact and high-speed probing in a space of 10 μm.
  • Double test method delivers an operation rate of 100%.
  • Full-net insulation continuity test using resistance: x10 max. speed*
  • High-speed test using capacitance: x2 max. speed*

Specifications Overview

Number of arms 2 (Upper: 2)
Mountable probes CP1073 series
Measurement parameters and measurement ranges Resistance measurement : 400.0 μΩ to 40.00 MΩ
4.000 Ω to 4.000 MΩ (T)
　 Capacitance measurement : 100.0 fF to 10.00 μF
　 MLCC measurement : 100.0 nF to 100.0 μF
　 Insulation measurement : 1.000 kΩ to 100.0 GΩ
1.000 kΩ to 250.0 MΩ (T)
　 Capacitor insulation measurement : 1.000 kΩ to 10.00 MΩ
　 High-voltage resistance measurement : 1.000 kΩ to 100.0 GΩ
1.000 kΩ to 250.0 MΩ (T)
　 Leak current measurement : 1.000 μA to 10.00 mA
　 Continuity : 400 mΩ to 1.000 kΩ
　 Open measurement : 4.000 Ω to 4.000 MΩ
　 Short measurement : 400.0 mΩ to 40.00 kΩ
　 (T): When measuring via the TEST FIXTURE
Judgment range -99.9% to +999.9% or absolute value
Total probing precision 10 μm (Square)
Probing pitch Min. 40 μm (when using CP1073-01)
Supported range of board thicknesses for clamping Follow option on BGA side
Probing area 75 mm (2.95 in) × 75 mm (2.95 in)
Power supply 200 V AC ±10% (three phase) 50/60 Hz (200 V, 220 V AC: specified upon order)
Maximum power consumption: 5 kVA
Dimensions and mass 1300 mm (51.18 in) W × 1670 mm (65.75 in) H × 1700 mm (66.93 in) D (Excluding protruding parts), 2000 kg (70,546.7 oz)

TEST FIXTURE CP1165-11 Specifications

Board dimensions Square 10 mm (0.39 in) to Square 80 mm (3.15 in)
Supported range of board thicknesses for clamping 0.1 mm (0.004 in) to 5.0 mm (0.20 in)
Notes Designed for each board
Board clamping Holder, shutter, and vacuum pump required separately
Supported pad diameter 200 μm or larger, 300 μm or larger when using Kelvin probe
Max. number of pins 8192

VACUUM UNIT FOR CAPACITANCE TEST E4101 Specifications

Board dimensions 50 mm (1.97 in) W × 90 mm (3.54 in) D to 105 mm (4.13 in) × 250 mm (9.84 in)
Supported range of board thicknesses for clamping 0.1 mm (0.004 in) to 0.8 mm (0.031 in)
Notes To accommodate the entire range of substrate thickness, it is necessary to replace the spacer for substrate thickness adjustment.
Board clamping VACUUM PUMP E4106 required separately

Designed specifically for package board testing, the FA1811 achieves both high-precision contact with a total probing precision of 10 μm, and a testing speed rivaling generic flying probe testers to meet ever increasing demands for greater analytical power, faster testing speeds and reduced costs.

Key Features

  • Achieve both high precision contact and high-speed probing in a space of 10 μm.
  • Double test method delivers an operation rate of 100%.
  • Full-net insulation continuity test using resistance: x10 max. speed*
  • High-speed test using capacitance: x2 max. speed*

Key Features

  • Achieve both high precision contact and high-speed probing in a space of 10 μm.
  • Double test method delivers an operation rate of 100%.
  • Full-net insulation continuity test using resistance: x10 max. speed*
  • High-speed test using capacitance: x2 max. speed*

Specifications Overview

Number of arms 2 (Upper: 2)
Mountable probes CP1073 series
Measurement parameters and measurement ranges Resistance measurement : 400.0 μΩ to 40.00 MΩ
4.000 Ω to 4.000 MΩ (T)
　 Capacitance measurement : 100.0 fF to 10.00 μF
　 MLCC measurement : 100.0 nF to 100.0 μF
　 Insulation measurement : 1.000 kΩ to 100.0 GΩ
1.000 kΩ to 250.0 MΩ (T)
　 Capacitor insulation measurement : 1.000 kΩ to 10.00 MΩ
　 High-voltage resistance measurement : 1.000 kΩ to 100.0 GΩ
1.000 kΩ to 250.0 MΩ (T)
　 Leak current measurement : 1.000 μA to 10.00 mA
　 Continuity : 400 mΩ to 1.000 kΩ
　 Open measurement : 4.000 Ω to 4.000 MΩ
　 Short measurement : 400.0 mΩ to 40.00 kΩ
　 (T): When measuring via the TEST FIXTURE
Judgment range -99.9% to +999.9% or absolute value
Total probing precision 10 μm (Square)
Probing pitch Min. 40 μm (when using CP1073-01)
Supported range of board thicknesses for clamping Follow option on BGA side
Probing area 75 mm (2.95 in) × 75 mm (2.95 in)
Power supply 200 V AC ±10% (three phase) 50/60 Hz (200 V, 220 V AC: specified upon order)
Maximum power consumption: 5 kVA
Dimensions and mass 1300 mm (51.18 in) W × 1670 mm (65.75 in) H × 1700 mm (66.93 in) D (Excluding protruding parts), 2000 kg (70,546.7 oz)

TEST FIXTURE CP1165-11 Specifications

Board dimensions Square 10 mm (0.39 in) to Square 80 mm (3.15 in)
Supported range of board thicknesses for clamping 0.1 mm (0.004 in) to 5.0 mm (0.20 in)
Notes Designed for each board
Board clamping Holder, shutter, and vacuum pump required separately
Supported pad diameter 200 μm or larger, 300 μm or larger when using Kelvin probe
Max. number of pins 8192

VACUUM UNIT FOR CAPACITANCE TEST E4101 Specifications

Board dimensions 50 mm (1.97 in) W × 90 mm (3.54 in) D to 105 mm (4.13 in) × 250 mm (9.84 in)
Supported range of board thicknesses for clamping 0.1 mm (0.004 in) to 0.8 mm (0.031 in)
Notes To accommodate the entire range of substrate thickness, it is necessary to replace the spacer for substrate thickness adjustment.
Board clamping VACUUM PUMP E4106 required separately

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