Hioki PCB and substrate inspection equipment leverages our core competency in high precision component testing. The FA1816 is a horizontal-loading, single-side flying probe tester with a rapid 100 times/second test speed.
FA1816 Product Introduction
Latent defects on HDI & substrate. Definitely detect out each FAIL. Hi-speed test by capacitance measurement. Much fewer steps than resistance testing.
Significantly improved operability
Screens: Important information has been consolidated on a single screen, and a graphical interface allows intuitive operation.
Control: A workflow menu is now available to streamline the test data creation process.
Master data creation: Previously, operators had to carry out a variety of steps, including acquiring basic data and qualifying a sample board as a reference master, in order to create the master data that serves as the standard for pass/fail judgment. The FA1816 automates this process so that the operator need only click a single button, shortening control time and reducing operator workload.
Key Features
- High-speed pattern testing using the capacitive measurement method - Max. 100 points/sec.
- Reduce probe marks in combination with the latest probes
- Significantly improved operability
Key Features
- High-speed pattern testing using the capacitive measurement method - Max. 100 points/sec.
- Reduce probe marks in combination with the latest probes
- Significantly improved operability
Specifications Overview
| Number of arms |
2 (top surface × 2) |
| Compatible probes |
1172 series, CP1072 series |
| Number of test steps |
999,999 steps |
| Test parameters and measurement ranges |
Resistance measurement : |
40.00 μΩ to 40.00 MΩ |
| |
Insulation measurement : |
1.000 kΩ to 500.0 MΩ |
| |
Capacitance measurement : |
100.0 fF to 10.00 μF |
| |
Leakage current measurement : |
1.000 μA to 10.00 mA |
| |
High-voltage resistance measurement : |
1.000 kΩ to 500.0 MΩ |
| |
Capacitor insulation measurement : |
1.000 kΩ to 10.00 MΩ |
| |
Open measurement : |
4.000 Ω to 4.000 MΩ |
| |
Short measurement : |
400.0 mΩ to 40.00 kΩ |
| Judgment range |
-99.9% to +999.9% or absolute value |
| Minimum pad pitch |
40 μm (with CP1075-09) |
| Minimum pad size |
10 μm (with CP1075-09) |
| Measurement speed |
Max. 100 points/sec. (0.1 mm movements, 2-arm simultaneous probing, capacitance measurement) |
| Testable boards |
50 mm (1.97 in) W × 50 mm (1.97 in) D to 610 mm (24.02 in) W × 510 mm (20.08 in) D, Thickness 0.1 mm (0.004 in) to 3.2 mm (0.13 in) |
| Maximum testable area |
610 mm (24.02 in) W × 510 mm (20.08 in) D |
| Power supply |
200 V, 220 V, 230 V, 240 V AC single phase (specify at time of order),
50 Hz/ 60 Hz, Maximum power consumption: 3 kVA |
| Dimensions and mass |
1303 mm (51.30 in) W × 1194 mm (47.01 in) H × 1167 mm (45.94 in) D (excluding protruding parts), 900 kg (31746 oz) |
Calibration
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