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HIOKI FA1816 FLYING PROBE TESTER

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Shop : Tools Bangladesh
Product ID : 4497
Brand : Hioki
Availability : In Stock (1)
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Hioki PCB and substrate inspection equipment leverages our core competency in high precision component testing. The FA1816 is a horizontal-loading, single-side flying probe tester with a rapid 100 times/second test speed.

FA1816 Product Introduction

Latent defects on HDI & substrate. Definitely detect out each FAIL. Hi-speed test by capacitance measurement. Much fewer steps than resistance testing.
Significantly improved operability
Screens: Important information has been consolidated on a single screen, and a graphical interface allows intuitive operation.
Control: A workflow menu is now available to streamline the test data creation process.
Master data creation: Previously, operators had to carry out a variety of steps, including acquiring basic data and qualifying a sample board as a reference master, in order to create the master data that serves as the standard for pass/fail judgment. The FA1816 automates this process so that the operator need only click a single button, shortening control time and reducing operator workload.

Key Features

  • High-speed pattern testing using the capacitive measurement method - Max. 100 points/sec.
  • Reduce probe marks in combination with the latest probes
  • Significantly improved operability

Key Features

  • High-speed pattern testing using the capacitive measurement method - Max. 100 points/sec.
  • Reduce probe marks in combination with the latest probes
  • Significantly improved operability

Specifications Overview

Number of arms 2 (top surface × 2)
Compatible probes 1172 series, CP1072 series
Number of test steps 999,999 steps
Test parameters and measurement ranges Resistance measurement : 40.00 μΩ to 40.00 MΩ
  Insulation measurement : 1.000 kΩ to 500.0 MΩ
  Capacitance measurement : 100.0 fF to 10.00 μF
  Leakage current measurement : 1.000 μA to 10.00 mA
  High-voltage resistance measurement : 1.000 kΩ to 500.0 MΩ
  Capacitor insulation measurement : 1.000 kΩ to 10.00 MΩ
  Open measurement : 4.000 Ω to 4.000 MΩ
  Short measurement : 400.0 mΩ to 40.00 kΩ
Judgment range -99.9% to +999.9% or absolute value
Minimum pad pitch 40 μm (with CP1075-09)
Minimum pad size 10 μm (with CP1075-09)
Measurement speed Max. 100 points/sec. (0.1 mm movements, 2-arm simultaneous probing, capacitance measurement)
Testable boards 50 mm (1.97 in) W × 50 mm (1.97 in) D to 610 mm (24.02 in) W × 510 mm (20.08 in) D, Thickness 0.1 mm (0.004 in) to 3.2 mm (0.13 in)
Maximum testable area 610 mm (24.02 in) W × 510 mm (20.08 in) D
Power supply 200 V, 220 V, 230 V, 240 V AC single phase (specify at time of order),
50 Hz/ 60 Hz, Maximum power consumption: 3 kVA
Dimensions and mass 1303 mm (51.30 in) W × 1194 mm (47.01 in) H × 1167 mm (45.94 in) D (excluding protruding parts), 900 kg (31746 oz)

Hioki PCB and substrate inspection equipment leverages our core competency in high precision component testing. The FA1816 is a horizontal-loading, single-side flying probe tester with a rapid 100 times/second test speed.

FA1816 Product Introduction

Latent defects on HDI & substrate. Definitely detect out each FAIL. Hi-speed test by capacitance measurement. Much fewer steps than resistance testing.
Significantly improved operability
Screens: Important information has been consolidated on a single screen, and a graphical interface allows intuitive operation.
Control: A workflow menu is now available to streamline the test data creation process.
Master data creation: Previously, operators had to carry out a variety of steps, including acquiring basic data and qualifying a sample board as a reference master, in order to create the master data that serves as the standard for pass/fail judgment. The FA1816 automates this process so that the operator need only click a single button, shortening control time and reducing operator workload.

Key Features

  • High-speed pattern testing using the capacitive measurement method - Max. 100 points/sec.
  • Reduce probe marks in combination with the latest probes
  • Significantly improved operability

Key Features

  • High-speed pattern testing using the capacitive measurement method - Max. 100 points/sec.
  • Reduce probe marks in combination with the latest probes
  • Significantly improved operability

Specifications Overview

Number of arms 2 (top surface × 2)
Compatible probes 1172 series, CP1072 series
Number of test steps 999,999 steps
Test parameters and measurement ranges Resistance measurement : 40.00 μΩ to 40.00 MΩ
  Insulation measurement : 1.000 kΩ to 500.0 MΩ
  Capacitance measurement : 100.0 fF to 10.00 μF
  Leakage current measurement : 1.000 μA to 10.00 mA
  High-voltage resistance measurement : 1.000 kΩ to 500.0 MΩ
  Capacitor insulation measurement : 1.000 kΩ to 10.00 MΩ
  Open measurement : 4.000 Ω to 4.000 MΩ
  Short measurement : 400.0 mΩ to 40.00 kΩ
Judgment range -99.9% to +999.9% or absolute value
Minimum pad pitch 40 μm (with CP1075-09)
Minimum pad size 10 μm (with CP1075-09)
Measurement speed Max. 100 points/sec. (0.1 mm movements, 2-arm simultaneous probing, capacitance measurement)
Testable boards 50 mm (1.97 in) W × 50 mm (1.97 in) D to 610 mm (24.02 in) W × 510 mm (20.08 in) D, Thickness 0.1 mm (0.004 in) to 3.2 mm (0.13 in)
Maximum testable area 610 mm (24.02 in) W × 510 mm (20.08 in) D
Power supply 200 V, 220 V, 230 V, 240 V AC single phase (specify at time of order),
50 Hz/ 60 Hz, Maximum power consumption: 3 kVA
Dimensions and mass 1303 mm (51.30 in) W × 1194 mm (47.01 in) H × 1167 mm (45.94 in) D (excluding protruding parts), 900 kg (31746 oz)

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