The UA1780 enables high-quality test programs in a short period of time by using net information that has been reverse-generated from Gerber data and component information libraries, and delivers maximum performance when used in conjunction with Hioki’s FA1240 Flying Probe Tester.
[Program,Test,Visualize] Populated Board Electrical Testing System
Hioki can prepare populated board testing system benchmarks if provided with the three types of data listed below.
[Program] FIT-LINE UA1780
[Test] FLYING PROBE TESTER FA1240
[Visualize] FAIL VISUALIZER UA1782
When testing populated boards, it's essential to create accurate data, measure boards accurately, and identify defective locations accurately.
Key Features
- No need for camera-based teaching
- No need to visually trace patterns under components
- Easy generation of high-quality test data without boards
- Support for the new FA1240 data format